Abstract Semiconducting tin oxide (SnO₂) nanostructures were successfully synthesized using a simple, rapid, and energy-saving microwave-assisted technique. The prepared SnO₂ samples were characterized by XRD, TEM, EDX, UV–DRS, photoluminescence, and TGA/DTA, demonstrating good crystal quality. The structure and surface morphology of the samples were investigated as a function of microwave irradiation using X-ray diffraction (XRD) and Transmission Electron Microscope (TEM). Structural studies by XRD revealed that the samples exhibit a tetragonal cassiterite structure, with a crystallite size observed to vary from 2 to 23 nm according to TEM measurements. UV-VIS diffuse reflectance spectroscopy (DRS) indicated that the direct and indirect band gap energies of SnO₂ are 3.86 and 1.56 eV, respectively. To highlight the optical properties of the SnO₂ nanostructures, the variation of photon energy concerning microwave radiation was investigated through absorption and extinction coefficient studies, refractive index, dielectric constant, and optical conductivity studies. The SnO₂ nanoparticles exhibited emission peaks at 428, 484, 525, and 632 nm in the photoluminescence spectrum. The major weight loss observed in thermo gravimetric analysis and differential thermal analysis (TGA/DTA) corresponds to the formation of tin oxide.
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Rajesh et al. (2024) studied this question.