We succeeded in developing an IGZO process with extremely high tolerance to hot carrier degradation. We verified the tolerance to hot carrier degradation by device evaluation using extremely severe DC stress. And we actually fabricated displays and confirmed that they can be displayed successfully. This high tolerance to hot carrier deterioration not only makes it possible to meet the needs for higher resolution and higher speed driving of liquid crystal displays, but also allows for higher speed rewriting of e‐Papers.
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Takeuchi et al. (2024) studied this question.
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