Behavioral Analysis of Regenerative and Dynamic Comparators in Terms of Speed and Thermal Reliability in Low-Power Applications

Comparators are crucial parts of circuit design because they can compare two analog voltage signals and provide a digital output based on this comparison. This study aims to investigate the performance attributes of regenerative and dynamic comparators within the context of their adaptability to scale down in size while ensuring consistent functionality and reliability under thermal constraints typical of low-power scenarios. Here, we used 16nm CMOS technology and varied supply voltage from 0.7V to 1.2V. Detailed analysis of a Two-Stage Dynamic Comparator (TS-DC) and a Doubled Transistor Latch Regenerative Comparator (DTL-RC) is highlighted concerning their power consumption, delay, and variations in supply voltage and temperature.