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July 8, 1967Bell System Technical Journal

The Si-SiO2Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance Technique

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Authors

ENE. H. NicollianUniversity of North Carolina at CharlotteAGA. GoetzbergerFraunhofer Institute for Solar Energy Systems

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Nicollian et al. (1967) studied this question.

synapsesocial.com/papers/69dbd88dc9a120f055a3cb8dhttps://doi.org/10.1002/j.1538-7305.1967.tb01727.x
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