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In this letter, the authors demonstrate a vertical wrap-gated field-effect transistor based on InAs nanowires [Proc. DRC, 2005, p. 157]. The nanowires have a diameter of 80 nm and are grown using selective epitaxy; a matrix of typically 10 /spl times/ 10 vertically standing wires is used as channel in the transistor. The authors measure current saturation at V/sub ds/=0.15 V (V/sub g/=0 V), and a high mobility, compared to the previous nanowire transistors, is deduced.
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Bryllert et al. (2006) studied this question.
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