Key result
Percutaneous closure of post-MI VSDs achieves high success but early mortality remains ~32%.
Why the study?
What are the success rates and clinical outcomes of percutaneous device closure for post-myocardial infarction ventricular septal defects?
Population
273 patients with post-myocardial infarction ventricular septal defects pooled from 13 patient series. Mean…
Design
Systematic_review
Follow-up
in-hospital/30-day
Authors
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High implantation success supports percutaneous post-MI VSD closure feasibility; leaves open optimal selection and timing to lower mortality.
Systematic Review (n=273)
Yes
What are the success rates and clinical outcomes of percutaneous device closure for post-myocardial infarction ventricular septal defects?
Percutaneous device closure of post-MI VSD has a high technical success rate (89%) but is associated with high 30-day mortality (32%), particularly in patients presenting with cardiogenic shock.
Schlotter et al. (2016) conducted a systematic review in Post-myocardial infarction ventricular septal defect (n=273). Percutaneous device closure was evaluated on In-hospital or 30-day mortality. Percutaneous device closure of post-myocardial infarction ventricular septal defects achieved an 89% successful implantation rate, but overall in-hospital or 30-day mortality remained high at 31.5%.
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