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October 1, 1970Journal of Applied Crystallography

Seeman–Bohlin X-ray diffractometer for thin films

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Authors

РФР. ФедерPrinceton UniversityBBB. S. BerryThe University of Texas Rio Grande Valley

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Федер et al. (1970) studied this question.

synapsesocial.com/papers/6a0895807f7fcd1344dded1bhttps://doi.org/10.1107/s0021889870006441
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