Key result
Left atrial voltage was significantly lower than right atrial voltage (1.6 vs 2.0 mV, P<0.001), and LA scarring independently predicted AF recurrence after catheter ablation.
Why the study?
What are the biatrial substrate properties in patients with atrial fibrillation and how do they impact catheter ablation outcomes?
Observational (n=117)
What are the biatrial substrate properties in patients with atrial fibrillation and how do they impact catheter ablation outcomes?
Absolute Event Rate: 1.6% vs 2%
p-value: p=<0.001
Left atrial scarring and lower voltage are associated with persistent AF and independently predict AF recurrence after catheter ablation.
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LA scarring may aid post-ablation risk stratification; leaves open whether substrate modification improves outcomes in randomized trials.
Chang et al. (2007) conducted an observational in Atrial Fibrillation (n=117). Biatrial electroanatomic mapping was evaluated on Atrial voltage (mV) (p=<0.001). Left atrial voltage was significantly lower than right atrial voltage (1.6 vs 2.0 mV, P<0.001), and LA scarring independently predicted AF recurrence after catheter ablation.
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