A new method for determining the series resistance of a solar cell from illuminated <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">I-V</tex> measurements is presented. The method, based on the computation of the area <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">A</tex> , under the <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">I-V</tex> curve, evaluates R <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">s</inf> using the equation <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Rₛ = 2[Voc/Isc - A/_sc^2 - (mkT/q) (1/Isc)]</tex> This technique takes advantage of the special feature of integration as a procedure to smooth data errors. The R <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">s</inf> obtained represents the resistive effects globally.
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Araújo et al. (1982) studied this question.
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