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▪ Abstract This paper reviews recent in situ studies of ferroelectric thin films using synchrotron X-ray scattering, with an emphasis on single-crystal perovskite films. We describe observations of thin film growth, the ferroelectric phase transition, and structural evolution during ferroelectric switching. The importance of quantitatively characterizing the internal structure of ferroelectric films under controlled electrical and mechanical boundary conditions is discussed.
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Fong et al. (2006) studied this question.
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