X-ray diffraction data for various materials reveal that naturally occurring microparacrystals cannot exceed a certain limiting size. The empirically obtained linear relationship between the square root of the limiting number of lattice planes within a paracrystal and the reciprocal value of the relative distance fluctuation between planes (degree of distortion) is discussed in the light of the paracrystal approach.
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Calleja et al. (1980) studied this question.