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A high frequency modulation method utilizing a photoelastic polarization modulator for the measurement of optical birefringence is described and discussed. Although the apparatus has the high sensitivity required to measure very small retardations, the accurate measurement of larger retardations is emphasized and a particularly simple null detection technique for such measurements is described. Results obtained for some common uniaxial crystals are presented and compared with previously obtained results.
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Modine et al. (1975) studied this question.
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