Answers are grounded in this paper and cite their sources.
Heavy ion induced destructive failures are reported in N-channel power IGBTs. For the first time, an experimental and 2D simulation investigation shows that latchup is involved in the triggering of the device.
No takes yet. Share an insight, caveat, or question.
Lorfèvre et al. (1997) studied this question.
Synapse has enriched 5 related papers. Consider them for comparative context: