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February 1, 1976IEEE Journal of Solid-State Circuits

Noise in buried channel charge-coupled devices

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Authors

RBR.W. BrodersenUniversity of California, BerkeleySES.P. EmmonsUniversity of Regina

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Brodersen et al. (1976) studied this question.

synapsesocial.com/papers/6a70fe34f44fa9f079debf76https://doi.org/10.1109/jssc.1976.1050690
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