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January 1, 1990Journal of The Electrochemical Society

High Frequency Capacitance‐Voltage Characteristics of Thermally Grown SiO2 Films on β ‐ SiC

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Authors

STS. M. TangUniversity of Notre DameWBW.B. BerryUniversity of Notre DameRKR. KworUniversity of Colorado Colorado Springs

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Cite This Study

Tang et al. (1990) studied this question.

synapsesocial.com/papers/6a72a60fa7fbea1e4408b61bhttps://doi.org/10.1149/1.2086370
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