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Si molecular-beam epitaxy (MBE) on smooth Si(100) surfaces is shown to occur at room temperature. We demonstrate for the first time that Si deposition becomes amorphous after growth of a limiting epitaxial thickness (hₑₚᵢ). hₑₚᵢ is {}10--30 {} at room temperature and increases rapidly at higher temperatures with a rate-dependent activation energy in the range 0.4--1.5 eV. The effect is tentatively linked to surface roughening during growth at low temperatures, and is probably general in MBE, also occurring for Si/Si(111), Ge/Si(100, and GaAs/GaAs(100).
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Eaglesham et al. (1990) studied this question.
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