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An effective molecular dipole moment of 7–13 e Å is routinely observed during time-dependent dielectric breakdown testing of silica-based dielectrics. A Mie-Grüneisen analysis of the molecular bonding states indicates that the upper end of the effective dipole moment range (13 e Å) is associated with a stretched silicon-oxygen bond while the lower end (7 e Å) is consistent with a hole-captured silicon-oxygen bond.
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J. W. McPherson (2004) studied this question.
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