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August 1, 2003IEEE Transactions on Electron Devices

Trends in the ultimate breakdown strength of high dielectric-constant materials

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JMJ. W. McPhersonJKJin‐Young KimASA. Shanware

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McPherson et al. (2003) studied this question.

synapsesocial.com/papers/6a9e5b9237bba822732cb5dehttps://doi.org/10.1109/ted.2003.815141
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