The learning curve associated with the implantation of the Nanostim leadless pacemaker

Figures

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  Fig. 1. Kaplan-Meier curve illustrating the estimation of remaining free from SADE at 30 days post-implant. The red line represents patients who underwent a Nanostim LP implantation by physicians who performed more than 10 procedures (group 1). The blue line represents patients in whom the operator performed equal or less than 10 procedures (group 2). Thirty-day event-free rate following device implant in patients from group 1 was 95.5%, and patients from group 2 with 92.6% did not experience any type of SADE (log rank p = 0.039)

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  Fig. 2. a Bar chart illustrating SADE in the first 30 days following Nanostim LP implantation per experience quartile. b Bar chart representing the SADE post-Nanostim LP implant within 30 days. SADE dropped significantly after 10 implants per operator (Q4 versus Q1 to Q3)

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  Fig. 3. Boxplot showing Nanostim implantation time per experience quartile. The first quartile represents the initial experience of operators (1–2), the second quartile (3–5), the third quartile (6–10), and the fourth quartile represents operators with most experience (>10). The horizontal middle solid line of the boxplots corresponds to the median of the quartile. Total procedure duration significantly decreased across the procedure quartiles (p < 0.0001). N number of patients, Q quartile

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  Fig. 4. Bar chart illustrating the required number of device repositioning attempts per operators experience quartile. The purple area corresponds to no need for device repositioning, the red area represents one extra repositioning attempt, and the green and brown areas represent two and more than two additional repositioning attempts, respectively. The need for multiple repositioning attempts during the Nanostim implant procedure reduced with increasing quartiles (p < 0.001)