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Polycrystalline lead-free piezoelectric [Bi0.5(Na0.7K0.2Li0.1)0.5]TiO3 (BNKLT) thin films were grown on Pt∕Ti∕SiO2∕Si substrates using pulsed laser deposition (PLD). In this letter, we report the ferroelectric properties and piezoresponse of the PLD-produced BNKLT thin films. X-ray diffraction characterization revealed a good crystallinity and a pure perovskite structure in the films. The films exhibited a well-defined polarization hysteresis loop with a remnant polarization Pr of 13.9μC∕cm2 and a coercive field Ec of 10.2MV∕m. The domain structure and its thermal-driven evolution from the ferroelectric to nonferroelectric phase were observed by piezoresponse force microscopy. The results were consistent with the phase transition profile of BNKLT bulk ceramics. Typical butterfly-shaped piezoresponse loop was obtained and the effective piezoelectric coefficient d33,f of the BNKLT thin films was about 64pm∕V.
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Wang et al. (2008) studied this question.
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