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The increasing complexity of digital integrated circuits (ICs) and the requirements of system quality and availability demand a new discipline in IC testing, known as built-in self-test (BIST). This paper introduces the basic approaches of this self-contained, reusable testing technique. It also presents different attributes of BIST schemes, their tradeoffs and available tools, and demonstrates a practical application of the schemes described.
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Agrawal et al. (1994) studied this question.
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