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January 1, 1965Journal of The Electrochemical SocietyOpen Access

Structural Evaluation of Silicon Oxide Films

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WPW. A. PliskinIBM (United States)HLH. LehmanPoughkeepsie Public Library District

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Pliskin et al. (1965) studied this question.

synapsesocial.com/papers/6a83dcdda0245b7cafe65be7https://doi.org/10.1149/1.2423333
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