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February 1, 1982Applied Optics

Multiple angle ellipsometric analysis of surface layers and surface layer contaminants

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Authors

MPM. E. PedinoffHRL Laboratories (United States)OSO. M. StafsuddUniversity of California, Los Angeles

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Pedinoff et al. (1982) studied this question.

synapsesocial.com/papers/6a84503e309bd08d9173129chttps://doi.org/10.1364/ao.21.000518
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