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The effects of temperature on m.o.s. transistors, operated in the pinchoff mode under constant-current conditions, are examined. A theoretical derivation, which accounts for interface and substrate conditions, is presented for the temperature coefficient of the gate-source voltage. Experimental measurements on both n- and pchannel silicon m.o.s. transistors are compared with theory.
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R.S.C. Cobbold (1966) studied this question.
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