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May 1, 1975IEEE Transactions on Electron Devices

Series resistance effects in semiconductor CV profiling

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Authors

JWJ. D. WileyUniversity of Wisconsin SystemGMG. L. MillerAT&T (United States)

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Wiley et al. (1975) studied this question.

synapsesocial.com/papers/6a85caa8e54a638bbf3d9e60https://doi.org/10.1109/t-ed.1975.18117
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