In situ transport measurements during the growth of a thin layer of thermally evaporated tellurium onto an oriented polymer film are presented. The system, which resembles the characteristics of a two-dimensional anisotropic network, is analyzed in terms of the current percolation theory. Parameters such as the percolation threshold and the critical exponents are calculated for the perpendicular and the parallel orientation. Within the limits of the experiments the values of t_∥ and t_⊥ are estimated to be 1.15 and 1.46, respectively.
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Hoffmann et al. (1997) studied this question.
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