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October 2, 2000Applied Physics Letters

X-ray diffraction analysis of the defect structure in epitaxial GaN

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Authors

HHH. HeinkeRWTH Aachen UniversityVKV. KirchnerUniversity of BremenSES. EinfeldtFerdinand-Braun-Institut

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Heinke et al. (2000) studied this question.

synapsesocial.com/papers/6a893ded1fb56efa37d43c63https://doi.org/10.1063/1.1314877
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