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July 1, 1988Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena

Characterization of localized atomic surface defects by tunneling microscopy and spectroscopy

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RHRobert J. HamersLawrence Livermore National Laboratory

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Robert J. Hamers (1988) studied this question.

synapsesocial.com/papers/6a893ec0cd098b93acdef27a https://doi.org/10.1116/1.584241

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