Micro-Raman spectroscopy to study local mechanical stress in silicon integrated circuits

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Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context:

1. 1Piezo-Raman measurements and anharmonic parameters in silicon and diamond1990 · 374 citations
2. 2A scaling consideration on mechanical stress-induced hot-carrier effects1992 · 15 citations
3. 3Raman characterisation of stress in recrystallised silicon-on-insulator1988 · 4 citations
4. 4High-resolution determination of the stress in individual interconnect lines and the variation due to electromigration1995 · 66 citations
5. 5Raman measurements of stress in silicon-on-sapphire device structures1982 · 58 citations