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March 1, 1992Semiconductor Science and TechnologyOpen Access

A scaling consideration on mechanical stress-induced hot-carrier effects

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Authors

AHA. HamadaHokkaido UniversityTFTakeshi FurusawaUtsunomiya UniversityNSNaoto SaitoShinshu University

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Hamada et al. (1992) studied this question.

synapsesocial.com/papers/6aa9f4f8207060c46bfbba9ahttps://doi.org/10.1088/0268-1242/7/3b/156
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