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March 1, 1989IEEE Electron Device Letters

Effects of trap-state density reduction by plasma hydrogenation in low-temperature polysilicon TFT

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Authors

IWI‐Wen WuNational Taiwan UniversityALA.G. LewisGender StudiesTHT.Y. HuangNational Health Research Institutes

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Wu et al. (1989) studied this question.

synapsesocial.com/papers/6a89797dc2b067567ebd4e01https://doi.org/10.1109/55.31689
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