Recent developments in X-ray diagnosis of laser produced plasmas, involving X-ray diffraction systems, are reviewed. Three methods currently under development are described: 1) Von Hamos focusing crystal X-ray spectrograph, 2) Laue crystal spectrograph and imaging devices, and 3) X-ray interferometry crystal devices. Some of the results shown are 1) a method of using mosaic crystals in a geometry which yields both high sensitivity and resolution; 2) ionic spectral lines of higher energy (12-14 keV) than has been previously observed; and 3) two-dimensional achromatic Laue imaging of~ 10 resolution.
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Yaakobi et al. (1983) studied this question.
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