What does this research mean for the field?

Monolithic CMOS pixel sensors maintain stable noise levels and uniform threshold distributions under high-intensity X-ray irradiation, confirming their robustness for use in future high-energy physics experiments. Novelty: ClaimNovelty.CONFIRMATORY. Consensus alignment: ConsensusAlignment.NEUTRAL.

What question did this study set out to answer?

Evaluate the threshold distribution, noise behavior, and radiation tolerance of monolithic CMOS pixel sensors before and after high-intensity X-ray exposure.

August 23, 2026PhysicsOpen Access

Performance of Monolithic CMOS Pixel Sensors Under X-Rays

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Authors

MAM. M. Ameen GDG. Dash AVAnusree Vijay

Discussion

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Overview

Experimental study demonstrates radiation tolerance and stable noise in monolithic CMOS pixel sensors under X-rays, indicating suitability for future particle colliders.

Key Points

Evaluate the threshold distribution, noise behavior, and radiation tolerance of monolithic CMOS pixel sensors before and after high-intensity X-ray exposure.
Characterized pixel threshold and noise as a function of front-end digital-to-analog converter (DAC) tuning parameters.
Subjected sensors to high-intensity X-ray irradiation and conducted pre- and post-irradiation performance comparisons across the pixel matrix.
Irradiation caused a systematic shift in detection thresholds—with larger shifts observed at lower threshold settings—while maintaining overall spatial uniformity across the matrix.
Electronic noise remained largely stable across the operational parameter space, establishing wide optimal operating regions under radiation stress.

Cite This Study

Ameen et al. (2026) studied this question.

synapsesocial.com/papers/6a8aae337677a341144470d5 https://doi.org/10.3390/physics8030062

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August 23, 2026PhysicsOpen Access

Performance of Monolithic CMOS Pixel Sensors Under X-Rays

View Full Paper

Ask AI

Bookmark

Authors

MAM. M. Ameen GDG. Dash AVAnusree Vijay

Discussion

Member takes

Overview

Experimental study demonstrates radiation tolerance and stable noise in monolithic CMOS pixel sensors under X-rays, indicating suitability for future particle colliders.

Key Points

Evaluate the threshold distribution, noise behavior, and radiation tolerance of monolithic CMOS pixel sensors before and after high-intensity X-ray exposure.
Characterized pixel threshold and noise as a function of front-end digital-to-analog converter (DAC) tuning parameters.
Subjected sensors to high-intensity X-ray irradiation and conducted pre- and post-irradiation performance comparisons across the pixel matrix.
Irradiation caused a systematic shift in detection thresholds—with larger shifts observed at lower threshold settings—while maintaining overall spatial uniformity across the matrix.
Electronic noise remained largely stable across the operational parameter space, establishing wide optimal operating regions under radiation stress.

Cite This Study

Ameen et al. (2026) studied this question.

synapsesocial.com/papers/6a8aae337677a341144470d5 https://doi.org/10.3390/physics8030062

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