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May 1, 1975Journal of The Electrochemical Society

Anodic Oxidation of GaAs as a Technique to Evaluate Electrical Carrier Concentration Profiles

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Authors

HMHelmut MüllerUniversity of StuttgartFEF. H. EisenGoethe University FrankfurtJMJ. W. MayerON Semiconductor (United States)

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Cite This Study

Müller et al. (1975) studied this question.

synapsesocial.com/papers/6a8ab537e0083a7c2c438ffahttps://doi.org/10.1149/1.2134285
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