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April 1, 1979IEEE Transactions on Electron Devices

Simple analytical models for the temperature dependent threshold behavior of depletion-mode devices

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Authors

RJR.C. JaegerAuburn UniversityFGF.H. GaensslenON Semiconductor (United States)

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Jaeger et al. (1979) studied this question.

synapsesocial.com/papers/6a8af83f5ef9ff12d7893191https://doi.org/10.1109/t-ed.1979.19453
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