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The ellipsometric measurements over the 350 to 700 nm wavelength range are carried out on a number of ferroelectric materials and the results are compared with those obtained by other authors. It is shown that the measured refractive index n spectra can be described by means of a one-oscillator model. The values of n at the opposite faces of the sample having a remnant polarization are different. Such a phenomenon may be connected with the different parameters of the space charge barrier at the opposite surfaces of the ferroelectric samples.
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Afanasjev et al. (1985) studied this question.
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