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September 9, 2005IEEE Sensors Journal

Generation-recombination noise in pseudomorphic Modulation-doped Al/sub 0.2/Ga/sub 0.8/As/In/sub 0.1/Ga/sub 0.9/As/GaAs micro-Hall devices

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Authors

VKVasyl P. KunetsMMR Technologies (United States)RPR. PomraenkeCarl von Ossietzky Universität OldenburgJDJulia Dobbert

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Kunets et al. (2005) studied this question.

synapsesocial.com/papers/6a8c4cc4efbb049866866f72https://doi.org/10.1109/jsen.2004.841436
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