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March 1, 1990Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena

Apparent temperature oscillations during molecular-beam epitaxy: A useful interferometric effect

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Authors

SWSteven L. WrightOxford Instruments (United Kingdom)TJThomas N. JacksonPennsylvania State UniversityRMR. F. MarksUniversité Paris-Sud

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Cite This Study

Wright et al. (1990) studied this question.

synapsesocial.com/papers/6a8c4cddce55b7ff59bd58e2https://doi.org/10.1116/1.585054
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