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February 1, 1972Journal of Applied Physics

Feedback Control Scheme for Scanning X-Ray Topography

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Authors

LML. J. van MellaertGSG. H. SchwuttkeArizona State University

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Mellaert et al. (1972) studied this question.

synapsesocial.com/papers/6a8e60d2e89c4e0bb511d6cchttps://doi.org/10.1063/1.1661177
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Also Consider

Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Feedback-Controlled X-Ray diffraction topography1970 · 14 citations
  2. 2X-Ray Stress Topography of Thin Films on Germanium and Silicon1968 · 74 citations
  3. 3X-Rays in Theory and Experiment1935 · 913 citations
  4. 4Direct Observation of Individual Dislocations by X-Ray Diffraction1958 · 311 citations
  5. 5New X-Ray Diffraction Microscopy Technique for the Study of Imperfections in Semiconductor Crystals1965 · 86 citations