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April 1, 1962Journal of Applied Physics

X-Ray Observations of Partial Dislocations in Epitaxial Silicon Films

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GSG. H. SchwuttkeArizona State University

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G. H. Schwuttke (1962) studied this question.

synapsesocial.com/papers/6a901b64028f4c29a42b151ahttps://doi.org/10.1063/1.1728768
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Also Consider

Synapse has enriched 4 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1X-Ray Diffraction Microscopy Study of Imperfections in Silicon Single Crystals1962 · 23 citations
  2. 2Direct Observation of Individual Dislocations by X-Ray Diffraction1958 · 311 citations
  3. 3Studies of Individual Dislocations in Crystals by X-Ray Diffraction Microradiography1959 · 332 citations
  4. 4Stacking Faults in Epitaxial Silicon1962 · 58 citations