Electronic states at edge dislocations in germanium are investigated by photo-conductivity measurements. Using a new technique of axial illumination the contribution of surfaces is suppressed which is difficult to separate from the dislocation effects otherwise. Furthermore, using a special analysis of the signals, true excitation spectra are derived of dislocation states from the data without the use of any recombination models.
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Mergel et al. (1977) studied this question.
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