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An accurate method for calculating crystallographic orientations from selected area electron diffraction patterns containing spots and Kikuchi lines is described. The accuracy of the method is shown experimentally to be ± 3′ which is compared with the accuracy of other published methods. The method is especially suitable for measuring misorientations across boundaries and it imposes the minimum constraint on the type of pattern that can be analysed.
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Pumphrey et al. (1970) studied this question.
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