Design and performance of a rapid-scanning X-ray diffractometer

The apparatus described enables the equatorial X-ray diffraction intensity distribution from radially symmetrical specimens to be obtained over the angle range 0 to 20° of Bragg θ in twenty seconds. Sequential scans are performed at the rate of two per minute and the X-ray intelligence is retained in the form of pulses by being recorded on magnetic tape which preserves the record with a high degree of fidelity. Also incorporated is an intensity analyser which enables the integrated count to be obtained between any two preset positions of Bragg θ, the limits being adjustable in steps of 0.1° to a high degree of precision. Although the instrument is designed primarily for the investigation of reaction kinetics in certain high polymeric substances of interest to the textile industry, there is obvious scope in other applications which involve relatively rapid changes in lattice parameters. Design details and some performance data are briefly mentioned together with an illustrative application.