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A new two-stage electron microscope has been designed and made for the express object of the microscopy of small objects by means of electron beams. The apparatus includes an optical microscope, and means are provided to bring any required object detail from the optical to the electron system. The focusing coils are mounted in the vacuum, and the design allows of the centering of the various parts on the electron beam axis.
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Martin et al. (1937) studied this question.
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