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July 1, 1979IEEE Transactions on Electron Devices

Degradation mechanism of GaAs MESFET's

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Authors

KMK. MizuishiHitachi (Japan)HKHirokazu KuronoHitachi (Japan)HSH. SatoYokohama National University

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Mizuishi et al. (1979) studied this question.

synapsesocial.com/papers/6a9285a51bc865c26749fcd3 https://doi.org/10.1109/t-ed.1979.19537

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1Reliability Study of GaAs MESFET's1976 · 38 citations