Evaluating the sensitivity to soft-errors of integrated circuits and systems became a main issue especially if they are intended to operate in space or at high altitudes. In this paper, a new fully automated SEU fault-injection method is presented and illustrated by its application to an 8051 microcontroller. Predicted SEU error-rates are in a good agreement with results issued from radiation ground testing, thus putting in evidence the accuracy of the studied method.
No takes yet. Share an insight, caveat, or question.
Mansour et al. (2013) studied this question.
Synapse has enriched 5 related papers. Consider them for comparative context: