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January 1, 1958Journal of the Optical Society of America

Simplified Treatment of Ellipsometry

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JFJ. A. FaucherWest Virginia UniversityGMGeorge M. McManusDEVCOM Army Research LaboratoryHTH. J. TrurnitMount Sinai Hospital

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Faucher et al. (1958) studied this question.

synapsesocial.com/papers/6a92cfe86a4f73282e184deahttps://doi.org/10.1364/josa.48.000051
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Also Consider

Synapse has enriched 4 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1The investigation of thin surface films on metals by means of reflected polarized light1933 · 85 citations
  2. 2The Ellipsometer, an Apparatus to Measure Thicknesses of Thin Surface Films1945 · 245 citations
  3. 3Optical Properties of Surface Films. II1949 · 32 citations
  4. 4Studies of Surface Films by Reflection of Polarized Light. I. A More Rigorous Algebraic Method for Computing Results1948 · 20 citations