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Thermally stimulated current (TSC) measurements have been performed in high resistivity (ϱ ≈ 107 ωcm) CdTe γ-ray detectors between 35 and 300°K. The TSC curves have been analysed by different methods, including those taking into account the retrapping of the carriers. The traps characteristics have been determined; especially three levels located at Ev + 0.13 eV, Ev + 0.30 eV, and Ec − 0.55 eV have been investigated.
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Scharager et al. (1975) studied this question.
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