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The results of low energy ion scattering are presented and their application to the determination of surface crystallography is described. The focussing of surface wedges and surface lenses is evident from these results. The detection of these focussed ions scattered off subsurface layers has allowed the measurement of the inelastic loss of energetic inert gas ions in the surface region. The energy dependence of the inelastic loss has been investigated and compared to theory.
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O’Connor et al. (1980) studied this question.
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