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A 20 ns 4-Mb CMOS SRAM operating at a single supply voltage of 3.3 V is described. The fast access time has been achieved by a newly proposed word-decoding architecture and a high-speed sense amplifier combined with the address transition detection (ATD) technique. The RAM has the fast address mode, which achieves quicker than 10-ns access, and the 16-b parallel test mode for the reduction of test time. A 0.6- mu m process technology featuring quadruple-polysilicon and double-metal wiring is adopted to integrate more than 16 million transistors in a 8.35-mm*18.0-mm die.>
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Hirose et al. (1990) studied this question.
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